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Ships within 48 hours · Estimated delivery Aug 1 - Aug 6
Click here for an example image of the high resolution capabilities of this probe
See our #253 Magnification Calibration slide-rule for quick assistance in obtaining magnification based on space counts of this product
6µm Top square size: 1
Imaging in both secondary and back scattered mode is very high
in 6" wafer carrier
TESPA-V2-SS Diamond & DLC Coating Click here for an exampleTESP V2, SUPERSHARP, 10 PACK DESCRIPTION Pack of 10 High quality etched silicon probes with backside Aluminum reflex coating, for TappingMode and other non contact modes. Combines the high consistency of the V2 design with a high aspect ratio, supersharp tip guaranteed by Bruker's proprietary process. Unmounted for use on standard AFMs.
