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Tighter dimensional specifications for improved probe to probe consistency
Each probe tip is individually imagedby FE-SEM to verify that the metallic probe tip radius is below 20nm
Contact resistance is typically 10 k
with reflective coating
Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 20 Tip Set Back( RNG): 5 - 15
DDLTESP-V2 Unmounted Tighter dimensional specifications for improvedDESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Brukers new series of conductive diamond coated probes provide consistent performance with high wear resistance in mechanical and electrical applications. In mechanical applications, these probes provide extreme wear resistance. On a Bruker Dimension Icon with FASTForce Volume Contact Resonance, these probes provide consistent results over many dozens of images. In electrical applications, these
