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The DNP-10 cantilever layout consists of an "A"and "B" cantilevers on one side of the probe
Tip characterization down to angstrom resolution is easily attained
Conductive with a contact resistance in the 100kOhm range
Bruker's sharpened Microlever AFM probes have soft Silicon Nitride cantileverswith sharpened Silicon Nitride tips
Screw used is M2 x 0
PELCO® XCS-8 130kHz The DNP-10 cantilever layout consistsDESCRIPTION PRODUCT SPECIFICATIONS Intended for EDS calibration and contains ANSI 316 stainless steel, SiO2, Mn, BN, C and a 200m Cu aperture in a 12. 7mm aluminum pin stub. Representative Certificate of Suitability for Purpose for PELCO XCS 8 Calibration Standard (279KB PDF) Composition for NBS SRM 1155 ANSI 316 Stainless Steel C = 0. 044% V = 0. 047% Ni = 12. 26% Si = 0. 509% Cr = 18. 46% Co = 0. 12% P = 0. 02% Mn = 1. 64% M0 = 2. 38% Fe = 64. 345%
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