Pay in 4 interest-free payments of $42.20 Learn more
Ships within 48 hours · Estimated delivery Aug 5 - Aug 10
#15342-4 Universal Spring Loaded Vise
ZEISS and TESCAN systems
75" x 2" x 1
400nm-Wide-Spike @ 6µm
Double 45º SEM Mount Ø25mm
Multi75-G All #15342-4 Universal Spring Loaded ViseStandard Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Standard Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM) operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard
US$ 110.49
US$ 156.55
US$ 423.63
US$ 13.00
US$ 151.86
US$ 13.00
US$ 31.40
US$ 147.67
