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MEM Grid Storage Box for 32 grids / 8 blocks
Silver content >60% by weight
Material Code Copper C Nickel N Gold G Aluminum A Molybdenum M Titanium T Stainless Steel S
the hole and bar widths are shown
Gold substrate layer thickness: 50nm (±5nm)
Triangular Test Grating for X- or Y-axis Select:Test grating TGT-1500, 3µm pitch, unmounted MEM Grid Storage Box forDESCRIPTION The TGT 1500 test grating is intended for SPM calibration in X or Y axis, determination of lateral and vertical scanner nonlinearity, detection of angular distortion and tip characterization. Nominal values for height and pitch are given below. Actual values come with the test grating. Structure: Si wafer with grating in top surface Pattern type: 1 D array of triangular steps with precise linear and angular dimensions Edge angle:
