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Size is 10" x 10" x 0
35 Cantilever Geometry: Triangular Cantilevers Number: 1 Back Side Coating: Proprietary reflective coating
This particular material choice prevents "binding" of parts in the SEM stage
The tip is designed to be ultra high strength and is fabricated by precision grinding of a solid diamond
Window angle toward the back is 35
Small Springloaded Vise Clamp nominal 88nm Size is 10" x 10"DESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain
