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Data in UV region is approximate
Enables the use of Hitachi 15 and 25mm mounts with M4 thread on JEOL SEMs (including JEOL NEOSCOPE)
*Uses average data measured for each production wafer
Analog vacuum and Amps display
It also holds two FIB grids conveniently close to the sample to mount and prepare TEM lamellae on the FIB grid for subsequent TEM imaging
ATEC-CONTAu-10 5X Data in UV region isDESCRIPTION AdvancedTEC Silicon SPM Probe, silicon cantilever for contact mode, detector and tip side: Au coating
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